Optical and Electronic Process of Nano-Matters

by Ohtsu, Motoichi

• ISBN13: 9780792369875
• ISBN10: 0792369874
• Format: Hardcover
• Copyright: 2001-08-01
• Publisher: Kluwer Academic Pub

Summary

This book reviews the resonant interaction between electromagnetic field/light and electrons/matters in a nanometric volume for the first time to invite the readers to a new field of nano-photonic/electronic science and technology. Especially, the unique feature of this book is to introduce the concept of nano-optics, i.e., near field optics into discussions on mesosopic systems. This book will enable undergraduate and graduate students, junior scientists, and engineers to systematicaly study the physics, diagnostics, and fabrication on nano-sized materials and devices.

Table of Contents

Preface	v
List of Authors	xi
Electronic and Electromagnetic Properties in Nanometer Scales	1	(56)
Introduction	1	(2)
Basic Features of Electronic and Optoelectronic Systems	3	(9)
Mesoscopic Electromagnetic Processes and Coupled-Mode Descriptions	12	(6)
Quantum Measurements and Interpretations	18	(6)
Measurements and Diagnosis at a Nanometer Scale	24	(6)
Electromagnetic Signal Transport as Circuit Design at a Nanometer Scales	30	(4)
Electrical Signals in Coherent/Incoherent Electronic Devices	34	(6)
Near-Field Optical Microscopes and the Micro-Macro Connection	40	(6)
Electron Interaction with Electromagnetic Fields in Nanometer Scale	46	(11)
References	52	(5)
Electron Transport in Semiconductor Quantum Dots	57	(38)
Introduction	57	(2)
Quantum Dot Atoms	59	(5)
Effects of a Magnetic Field	64	(5)
Manipulation of the Lateral Potential Geometry of a Vertical Dot	69	(5)
Quantum Dot Molecules	74	(5)
Double Dot Molecules-Planar Configuration	79	(12)
Summary	91	(4)
References	92	(3)
Electron Energy Modulation with Optical Evanescent Waves	95	(28)
Introduction	95	(1)
Quantum Modulation of Electrons	96	(1)
Micro-Gap Interaction Circuits	97	(2)
Metal Film Gap and Dielectric Film Circuits	99	(4)
Metal Micro-Slit	103	(7)
Preliminary Experiment	110	(9)
Fabrication of the Micro-Slit	119	(1)
Summary	120	(3)
References	121	(2)
Interactions of Electrons and Electromagnetic Fields in a Single Molecule	123	(24)
Single Electron Tunneling and Photon-Assisted Tunneling	123	(9)
STM-Induced Photon Emission from Single Molecules on Cu(100)	132	(15)
References	144	(3)
Theory of Electronic and Atomic Processes in Scanning Probe Microscopy	147	(34)
Introduction	147	(2)
Tunneling Current in STM	149	(2)
The STM Images of Si(111) √3 x √3-Ag and -Sb Surfaces	151	(3)
The Effect of a Microscopic Structure at the Tip	154	(2)
STM Images of Oxygen Chemisorbed Si(001) Surfaces	156	(2)
Formation of Atomic Point Contact and Electron Transmission through Atom Bridges	158	(2)
Quantum Transport Through Atom Bridges	160	(4)
Frictional-Force Microscopy	164	(4)
Tapping-Mode Atomic Force Microscopy	168	(4)
Theory of Noncontact-Mode Atomic-Force Microscopy	172	(5)
Summary	177	(4)
References	178	(3)
Tunneling-Electron Luminescence Microscopy for Multifunctional and Real-Space Characterization of Semiconductor Nanostructures	181	(20)
Introduction	181	(1)
Limitations of Conventional Luminescence Microscopy	182	(2)
Tunneling Electron Luminescence (TL) Microscopy	184	(2)
TL Microscopy Using Tip Collection	186	(7)
Application: Characterization of Semiconductor Nanostructures	193	(5)
Conclusions	198	(3)
References	199	(2)
Near-Field Optical Spectroscopy of Single Quantum Dots	201	(18)
Introduction	201	(3)
Fabrication of Near-Field Fiber Probe	204	(1)
Fundamental Performance of Near-Field Probe	205	(2)
Low-Temperature PL Spectroscopy of Single QDs	207	(3)
Room-Temperature PL Spectroscopy of Single QDs	210	(1)
Time-Resolved PL Spectroscopy of Single QDs	211	(3)
Modulated Absorption Spectroscopy of Single QDs	214	(2)
Summary	216	(3)
References	217	(2)
Chemical Vapor Deposition of Nanometric Materials by Optical Near-Fields: Toward Nano-Photonic Integration	219	(16)
Introduction	219	(1)
Principles	220	(1)
Depositing Zinc	221	(5)
Depositing Zinc Oxide	226	(4)
Toward Nano-Photonic Integration	230	(2)
Summary	232	(3)
References	233	(2)
Noncontact Atomic Force Microscopy	235	(42)
Introduction-Historical Background	235	(1)
Guidelines for Spatial Resolution	236	(5)
Problems in AFM Measurement under the Contact mode	241	(1)
Noncontact Atomic Force Microscopy (Experimental Method)	242	(3)
Experimental Results on Compound Semiconductors	245	(7)
Experimental Results on Si Semiconductors	252	(12)
Noncontact AFM Imaging on an AG(111) Surface	264	(3)
Simultaneous Imaging of Topography and Electrostatic Force on n+-GaAs(110)	267	(7)
Summary	274	(3)
References	275	(2)
Correlation Between Interface States and Structures Deduced From Atomic-Scale Surface Roughness in Ultrathin SiO2/Si System	277	(22)
Introduction	277	(1)
Experimental Details	277	(1)
SiO2/Si Interface Structures	278	(7)
Oxidation-induced Atomic-scale Surface Roughness	285	(5)
Interface Electronic States and Their Correlation with Interface Structures	290	(1)
Valence Band Discontinuities at and near the SiO2/Si Interface	291	(4)
Summary	295	(4)
References	296	(3)
Characterization of Molecular Films by A Scanning Probe Microscope	299	(30)
Local Area Visualization of Organic Ultra-Thin Films by the Scanning Probe Microscope	299	(6)
Application to Anchoring Phase Studies	305	(7)
Local Area Characterization of Organic Ultra-Thin Films by a Scanning Probe Microscope	312	(8)
Application to Molecular Devices	320	(9)
References	326	(3)
Index	329