Product Integrity and Reliability in Design

by Evans, John W.; Evans, Jillian Y.

• ISBN13: 9781852332150
• ISBN10: 1852332158
• Format: Paperback
• Copyright: 2001-03-01
• Publisher: Springer Verlag

Summary

Product Integrity and Reliability in Designis intended to serve either as a text for graduate students or as a reference for practicing engineers. The book develops the root-cause approach to reliability - often referred to as "physics of failure" in the reliability engineering field. It approaches the subject from the point of view of a process and integrates the necessary methods to support that process. The book can be used to teach first- or second-year postgraduate students in mechanical, electrical, manufacturing and materials engineering about addressing issues of reliability during product development. It will also serve practicing engineers involved in the design and development of electrical and mechanical components and systems, as a reference. The book takes an interdisciplinary approach appropriate to system engineering, stressing concepts that can be integrated into design and placing less emphasis on traditional assumptions about reliability and analysis as a separate development activity. Several case studies emphasize the understanding of failure mechanisms and failure prevention and show how reliability methods, including simulation and testing can be integrated into design and development.

Table of Contents

Part I: Concepts
Introduction to Product Integrity and Reliability Assessment	3	(17)
John W. Evans
Jillian Y. Evans
Dong-su Ryu
Elements of Probability for Reliability Assessment	20	(34)
Hyung S. Hahn
Concepts in Reliability for Design	54	(35)
Jillian Y. Evans
John W. Evans
Part II: Failure Mechanics
Overstress Failure and Load - Strength Interference	89	(24)
John W. Evans
Elements of Fatigue and Related Mechanisms	113	(33)
John W. Evans
Applications of Finite Element Analysis and Whole Field Stress Measurement	146	(32)
Mark S. Fan
Elements of Corrosion	178	(26)
John W. Evans
Sun-wook Kim
Failures in Electronic Assemblies and Devices	204	(29)
Michael Pecht
Patrick McCluskey
Jillian Y. Evans
Case Studies in Product Failure and Failure Analysis	233	(20)
John W. Evans
Part III: Testing and Failure Analysis
Introduction to Testing and Test Effectiveness for Reliability Assessment	253	(35)
Steven L. Cornford
Design and Analysis of Statistical Experiments	288	(24)
John W. Evans
Jillian Y. Evans
Accelerated Testing and Data Analysis	312	(26)
John W. Evans
Kyoung-Taeg Lee
Failure Analysis of Assemblies and Devices	338	(32)
Michael Pecht
Patrick McCluskey
Case Studies in Product Development and Improvement	370	(17)
John W. Evans
Jillian Y. Evans
H.S. Jeon
Appendices	387	(12)
Index	399