Radiation Effects on Embedded Systems

by Velazco, Raoul; Fouillat, Pascal; Reis, Ricardo A. L.

• ISBN13: 9781402056451
• ISBN10: 1402056451
• Format: Hardcover
• Copyright: 2007-07-04
• Publisher: Springer Verlag

Summary

Radiation Effects on Embedded Systems aims at providing the reader with the major guidelines for coping with radiation effects on components supposed to be included in today's application devoted to operate in space, but also in the atmosphere at high altitude or at ground level. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, from 20 to 25 November 2005. This book will provide all IC engineers with useful information regarding outside (environmental) influences on their designs, in this way we see this to be an excellent reference.

Table of Contents

Radiation space environment	p. 1
Radiation effects in microelectronics	p. 11
In-flight anomalies on electronic devices	p. 31
Multi-level fault effects evaluation	p. 69
Effects of radiation on analog and mixed-signal circuits	p. 89
Fundamentals of the pulsed laser technique for single-event upset testing	p. 121
Design hardening methodologies for ASICs	p. 143
Fault tolerance in programmable circuits	p. 161
Automatic tools for design hardening	p. 183
Test facilities for SEE and dose testing	p. 201
Error rate prediction of digital architectures : test methodology and tools	p. 233
Using the SEEM software for laser SET testing and analysis	p. 259
Table of Contents provided by Blackwell. All Rights Reserved.