Scanning Probe Microscopy of Functional Materials

by Kalinin, Sergei V.; Gruverman, Alexei

• ISBN13: 9781441965677
• ISBN10: 144196567X
• Format: Hardcover
• Copyright: 2010-12-30
• Publisher: Springer Verlag

Summary

The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.

Table of Contents

Spectroscopic SPM at the Resolution Limits
Excitation and Mechanisms or Single Molecule Reactions in Scanning Tunneling Microscopy	p. 3
High-Resolution Architecture and Structural Dynamics of Microbial and Cellular Systems: Insights from in Vitro Atomic Force Microscopy	p. 39
Dynamic Spectroscopic SPM
Dynamic Force Microscopy and Spectroscopy in Ambient Conditions: Theory and Applications	p. 71
Measuring Mechanical Properties on the Nanoscale with Contact Resonance Force Microscopy Methods	p. 95
Multi-Frequency Atomic Force Microscopy	p. 125
Dynamic Nanomechanical Characterization Using Multiple-Frequency Method	p. 153
Thermal Characterization by SPM
Toward Nanoscale Chemical Imaging: The Intersection of Scanning Probe Microscopy and Mass Spectrometry	p. 181
Dynamic SPM Methods for Local Analysis of Thermo-Mechanical Properties	p. 199
Electrical and Electromechanical SPM
Advancing Characterization of Materials with Atomic Force Microscopy-Based Electric Techniques	p. 233
Quantitative Piezoresponse Force Microscopy: Calibrated Experiments, Analytical Theory and Finite Element Modeling	p. 301
High-Speed Piezo Force Microscopy: Novel Observations of Ferroelectric Domain Poling, Nucleation, and Growth	p. 329
Polar Structures in Relaxors by Piezoresponse Force Microscopy	p. 345
Symmetries in Piezoresponse Force Microscopy	p. 385
Novel SPM Concepts
New Capabilities at the Interface of X-Rays and Scanning Tunneling Microscopy	p. 405
Scanning Ion Conductance Microscopy	p. 433
Combined Voltage-Clamp and Atomic Force Microscope for the Study of Membrane Electromechanics	p. 461
Dynamic and Spectroscopic Modes and Multivariate Data Analysis In Piezoresponse Force Microscopy	p. 491
Polarization Behavior in Thin Film Ferroelectric Capacitors at the Nanoscale	p. 529
Index	p. 541
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