Scanning and Transmission Electron Microscopy An Introduction

by Flegler, Stanley L.; Heckman, John W.; Klomparens, Karen L.

• ISBN13: 9780716770473
• ISBN10: 0716770474
• Format: Hardcover
• Copyright: 1993-09-23
• Publisher: Oxford University Press

Summary

This authoritative volume, ideal for use in the laboratory, presents the practical and theoretical fundamentals of scanning and transmission electron microscopy--together in one convenient volume. Clear and concise explanations coupled with instructive diagrams and photographs guide youthrough microscope operation, image production, analytical techniques, and potential applications to various disciplines. Specimen preparation is discussed in detail, with emphasis on specific parameters for biological specimens. Since each laboratory has its own procedures, this unique bookcovers the essentials of scanning and transmission electron microscopy while leaving the laboratory particulars to individual discretion. Unmatched in scope and clarity--and filled with helpful diagrams, photographs, and drawings--this text offers the best introduction to scanning and transmissionelectron microscopy available. Due to its comprehensive coverage, the book will serve as an ideal course text in the electron microscopy classes organized for the benefit of advanced students in both the biological and physical sciences.

Author Biography

Stanley L. Flegler, John W. Heckman, Jr., and Karen L. Klomparens are at the Center for Electron Optics at Michigan State University.

Table of Contents

1. Introduction 2. Electron Sources and Electron Lenses 2.1. Electron Sources 2.2. Electron Lenses 3. Vacuum Systems 3.1. Vacuum Pumps Commonly Used in EM Labs 3.2. Methods of Measuring Vacuums 3.3. Vacuum Systems Used in Electron Microscopy 4. The Transmission Electron Microscope 4.1. Theory of Operation 4.2. Real Images 4.3. Virtual Images 4.4. Depth of Field and Depth of Focus 4.5. Anatomy of a Transmission Electron Microscope 4.6. Medium- and High-Voltage Transmission Electron Microscopy 5. The Scanning Electron Microscope 5.1. Theory of Operation 5.2. Specimen-Beam Interactions 5.3. Machine Variables 5.4. Ultrahigh-Resolution SEMS 5.5. Environmental SEMS 5.7. Scanning Tunneling and Atomic Force Microscopy 6. Specimen Preparation for TEM 6.1. Negative Staining of Small Particulates 6.2. Ultrathin Sectioning of Larger Samples 6.3. Vacuum Evaporators and Evaporation Techniques 6.4. Shadowcasting and Replica Techniques 6.5. Cytological Techniques 6.6. Preparation of Nonbiological Materials 7. Specimen Preparation for SEM 7.1. Mounting 7.2. Coating for Conductivity 7.3. Special Methods for Various Sample Types 7.4. Biological Sample Preparation 7.5. Alternative Methods for Biological Samples 7.6. SEM Histochemistry for Biological Samples 8. X-Ray Analysis 8.1. X-ray Production and Naming 8.2. Measuring the Energy and Wavelength of X Rays 8.3. Construction of the EDS Detector 8.4. Construction of the EDS X-Ray Analyzer 8.5. Outputs 8.6. Spectrum Accumulation and Interpretation 8.7. Optimizing the Detection of X Rays 8.8. Artifacts 8.9. Quantitative Analysis 8.10. Sample Preparation 9. Electron Micrographic Techniques 9.1. Silver Graphic Process 9.2. Photographic Printing 9.3. Transmission Electron Micrography 9.4. Scanning Electron Micrography 9.5. The Electronic Darkroom 9.6. Micrograph Presentation and Publication