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9780819472861

Two- and Three-dimensional Methods for Inspection and Metrology VI

by ; ;
  • ISBN13:

    9780819472861

  • ISBN10:

    0819472867

  • Format: Paperback
  • Copyright: 2008-08-28
  • Publisher: Society of Photo Optical
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Summary

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Table of Contents

Standardization of noncontact 3D measurement
Geometric errors in 3D optical metrology systems
Modelling and compensating measurement errors caused by scattering in time-of7flight cameras
Measurement of optical free-form surfaces with fringe projection
Development of real-time shape measurement system using whole-space tabulation method
Measurement and stitching of regular cloud of points
3D surface defect analysis and evaluation
Robust depth-from-defocus for autofocusing In the presence of image shifts
High dynamic range scanning technique
Phase-shifting shadow moire using the Carre algorithm
Simultaneous measurement of internal and external profiles using a ring beam device
3-D shape measurement by use of a modified Fourier transform method
Challenges and opportunities for 3D optical metrology: what is needed today from an Industry perspective
Camera-based 10KHz distance gage
Calibration of a soft x-ray projection system
Merging of range images for Inspection or safety applications
Optimal measurement method for diffraction-based overlay metrology
3D profile measurement of large-scale curvature plates using structured light source
Evaluation of large conic concave surfaces using a coordinate measurement machine and genetic algorithms
Author Index
Table of Contents provided by Blackwell. All Rights Reserved.

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