We're sorry, but eCampus.com doesn't work properly without JavaScript.
Either your device does not support JavaScript or you do not have JavaScript enabled.
How to enable JavaScript in your browser.
Need help? Call 1-855-252-4222
by Zoubir, Abdelhak M.; Koivunen, Visa; Ollila, Esa; et al.
by Maronna, Ricardo A.; Martin, R. Douglas; Yohai, Victor J.; et al.
by Jurecková, Jana; Sen, Pranab; Picek, Jan
by Maronna, Ricardo A.; Martin, Douglas R.; Yohai, Victor J.
by Hampel, Frank R.; Ronchetti, Elvezio M.; Rousseeuw, Peter J.; et al.
by Huber, Peter J.; Ronchetti, Elvezio M.
by Jureckovß; Jana
by Ilias Diakonikolas; Daniel M. Kane
by Committee on Applied and Theoretical Statistics; Board on Mathematical Sciences and Their Applications
by Agostinelli, Claudio; Basu, Ayanendranath; Filzmoser, Peter; et al.