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Introduction | p. 1 |
Silver Metallization | p. 1 |
Properties of Silver, Copper and Aluminum | p. 5 |
References | p. 6 |
Silver Thin Film Analysis | p. 7 |
Introduction | p. 7 |
Rutherford Backscattering Spectrometry | p. 8 |
Scattering Kinematics | p. 8 |
Scattering Cross Section | p. 9 |
Depth Scale | p. 10 |
Ion Resonances | p. 11 |
X-ray Diffractometry | p. 12 |
References | p. 13 |
Diffusion Barriers and Self-encapsulation | p. 15 |
Introduction | p. 15 |
Titanium-nitride Self-encapsulation of Silver Films | p. 16 |
Introduction | p. 16 |
Experimental Details | p. 17 |
Results | p. 17 |
Discussion | p. 20 |
Conclusions | p. 22 |
Corrosion of Encapsulated Silver Films Exposed to a Hydrogen-sulfide Ambient | p. 22 |
Introduction | p. 22 |
Experimental Details | p. 23 |
Results | p. 24 |
Discussion | p. 28 |
Conclusions | p. 29 |
Tantalum-Nitride Films as Diffusion Barriers | p. 30 |
Introduction | p. 30 |
Experimental Details | p. 30 |
Results | p. 31 |
Discussion | p. 39 |
Conclusions | p. 41 |
References | p. 42 |
Thermal Stability | p. 43 |
Introduction | p. 43 |
Silver-Aluminum Films | p. 44 |
Introduction | p. 44 |
Results | p. 44 |
Discussion and Conclusions | p. 46 |
Silver Deposited on Parylene-n by Oxygen Plasma Treatment | p. 48 |
Introduction | p. 48 |
Experimental Details | p. 49 |
Results | p. 50 |
Discussion | p. 55 |
Conclusions | p. 57 |
Effects of Different Annealing Ambients on Silver-Aluminum Bilayers | p. 57 |
Introduction | p. 57 |
Experimental Details | p. 58 |
Results | p. 59 |
Discussion | p. 67 |
Conclusions | p. 69 |
Thickness Dependence on the Thermal Stability of Silver Thin Films | p. 69 |
Introduction | p. 69 |
E xperimental Details | p. 70 |
Results and Discussion | p. 70 |
Conclusions | p. 73 |
References | p. 74 |
Silver Electromigration Resistance | p. 75 |
Introduction | p. 75 |
Experimental Details | p. 76 |
Results and Discussion | p. 76 |
Conclusions | p. 81 |
References | p. 81 |
Integration Issues | p. 83 |
Factors Influencing the Kinetics in Silver-Aluminum Bilayer Systems | p. 83 |
Introduction | p. 83 |
Experimental Details | p. 84 |
Results | p. 84 |
Discussion | p. 93 |
Conclusions | p. 97 |
Effect of Metals and Oxidizing Ambient on Interfacial Reactions | p. 97 |
Introduction | p. 97 |
Experimental Details | p. 98 |
Results | p. 98 |
Discussion | p. 101 |
Conclusions | p. 103 |
Silver Metallization on Silicides with Nitride Barriers | p. 103 |
Introduction | p. 103 |
Experimental Details | p. 104 |
Results and Discussions | p. 105 |
Conclusions | p. 109 |
References | p. 110 |
Summary | p. 113 |
Introduction | p. 113 |
Thermal Stability: Diffusion Barriers and Self-encapsulation | p. 113 |
Electromigration Resistance | p. 117 |
Future Trends | p. 118 |
References | p. 119 |
Index | p. 121 |
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The New copy of this book will include any supplemental materials advertised. Please check the title of the book to determine if it should include any access cards, study guides, lab manuals, CDs, etc.
The Used, Rental and eBook copies of this book are not guaranteed to include any supplemental materials. Typically, only the book itself is included. This is true even if the title states it includes any access cards, study guides, lab manuals, CDs, etc.