Structure-Property Relationships of Oxide Surfaces and Interfaces

by Carter, C. Barry; Pan, Xiaoqing; Sickafus, Kurt; Tuller, Harry L.; Wood, Tom E.

• ISBN13: 9781558995642
• ISBN10: 1558995641
• Format: Hardcover
• Copyright: 2001-09-01
• Publisher: Materials Research Society

Summary

Computer modeling has reached a new level of sophistication, where it can be used to predict the structure and energy of interfaces in oxides. Nowhere is this activity more important than in these ceramic materials, where more applications are being discovered but the fundamental properties are often poorly known or not known at all. As more multicomponent oxides are exploited for their novel properties, both the experimentalist and the modeler will be challenged to predict or explain the behavior of these materials under a wide range of conditions. This book focuses on the interfaces of oxide-based materials. The areas of composite materials, materials synthesis, microscopy, defect chemistry and structure, nanomaterials technologies, thin-film synthesis and characterization, computer modeling, structural characterization and properties measurement of surfaces and internal interfaces are featured together with advances in computer modeling of oxide interfaces. A series on structural characterization of surfaces and interfaces utilizing advanced microscopic techniques is also provided, as is a series on the measurement of properties of real interfaces (diffusion, mechanical, electrical and magnetic).

Table of Contents

Preface	xi
Materials Research Society Symposium Proceedings	xii
GRAIN BOUNDARIES IN OXIDES
Effects of Y and Zr Dopants on Grain Boundary Structure in Creep Resistant Polycrystalline Alumina	1	(1)
S. Cargill III
C.M. Wang
J.M. Rickman
H.M. Chan
M.P. Harmer
Atomic and Electronic Structure of Symmetric Tilt Boundaries in ZnO	2	(1)
Fumiyasu Oba
Shigeto R. Nishitani
Hirohiko Adachi
Isao Tanaka
Masanori Kohyama
Shingo Tanaka
The Origin of Electrical Activity at Grain Boundaries in Perovskites and Related Materials	3	(2)
S.J. Pennycook
M. Kim
G. Duscher
N.D. Browning
K. Sohlberg
S.T. Pantelides
Simulation of a Grain Boundary in Zirconia	5	(1)
Michael W. Finnis
Anthony T. Paxton
High-Resolution Electron Microscopy of Grain Boundary Structures in Yttria-Stabilized Cubic Zirconia	6	(1)
K.L. Merkle
L.J. Thompson
G.-R. Bai
J.A. Eastman
Atomic Scale Characterization of Oxygen Vacancy Segregation at SrTiO3 Grain Boundaries	7
R.F. Klie
N.D. Browning
INTERFACES IN COMPOSITES AND MULTILAYERS
Interfacial Structure of BaRuO3 Thin Films Grown on (111) SrTiO3	4	(2)
W. Tian
M.K. Lee
C.B. Eom
X.Q. Pan
Channeling Studies of CeO2 and Ce1-xZrxO2 Films on Yttria-Stabilized ZrO2(111)	6	(1)
V. Shutthanandan
S. Thevuthasan
Y.J. Kim
C.H.F. Peden
Atomic Force Microscopy Studies of Fracture Surfaces From Oxide/Polymer Interfaces	7
Maura Jenkins
Jeffrey Snodgrass
Aaron Chesterman
Reinhold H. Dauskardt
John C. Bravman
POSTER SESSION
Interface Reactions in LiNbO3 Based Optoelectronics Devices	2	(1)
Hirotoshi Nagata
Yasuyuki Miyama
Kaoru Higuma
Yoshihiro Hashimoto
Futoshi Yamamoto
Yuuji Yamane
Miki Yatsuki
Oxygen Exchange on a Highly Oriented Thin Film Electrode	3	(1)
Y.L. Yang
C.L. Chen
G.P. Luo
C.W. Chu
A.J. Jacobson
Microscopic Structure and Energetics of the Pd/SrTiO3 (001) Interface	4	(1)
Thorsten Ochs
Sibylle Kostlmeier
Christian Elsasser
Activation of an Al-Zn-Mg-Li Alloy by the Presence of Precipitates to be Used as Sacrificial Anode	5	(1)
S. Valdez
M.A. Talavera
J. Genesca
J.A. Juarez-Islas
Atomic Force and Electron Microscopy Studies of Tin Dioxide Films Prepared From Solutions With High Fluorine Content	6	(5)
Dwight R. Acosta
Rebeca Castanedo
Walter Estrada
Rosario Avila-Godoy
Oxides Influence on Electrical Properties of Si and A2B6 Materials	11	(1)
Andrii M. Andrukhiv
Galina Khlyap
Mikhail Andrukhiv
Violetta Belosertseva
Influence of Oxidation on Boron Segregation to Grain Boundaries of In Situ Fractured Ni3Al Alloys	12	(2)
S.A. Koch
D.T.L. van Agterveld
G. Palasantzas
J.Th.M. De Hosson
Influence of Fe on the Morphology of Spinel in the System MgO-Al2O3-Fe2O3	14	(2)
O.V. Kharissova
U. Ortiz
M. Hinojosa
The Interfacial Reaction Products and Mechanical Properties With Oxidized Layer Thickness of SiC Particle in 2014AI/SiC Composites	16	(1)
Youngman Kim
Jong-Hoon Jeong
Jae-Chul Lee
Segregation of Yttrium at Grain Boundaries in α-Al2O3	17	(2)
Stefan Nufer
Wolfgang Kurtz
Manfred Ruhle
Origin of Voids at the Interface of Wafer Bonded Sapphire on Sapphire	19	(1)
Stephan Senz
Pascal Kopperschmidt
Nikolai Dimitri Zakharov
Misfit Accommodation Mechanisms at Moving Reaction Fronts During the Initial Growth Stage of La2Zr2O7-Based Pyrochlore on (001)YSZ	20	(12)
C.J. Lu
S. Senz
D. Hesse
Segregation of Fission Products to Surfaces of UO2	32	(1)
C.R. Stanek
Robin W. Grimes
Mark R. Bradford
Ellipsometry as a Sensitive Technique to Probe Film-Substrate Interfaces: Al2O3 on Si(100)	33	(5)
M.P. Singh
G. Raghavan
A.K. Tyagi
S.A. Shivashankar
Microstructure of Sputter Deposited TiO2/SiO2 Multilayer Optical Coatings	38	(3)
E. Sutter (Mateeva)
P. Sutter
J.J. Moore
Relationships Between Film Chemistry, Structure and Mechanical Properties in Titanium Oxide	41	(1)
M. Pang
D.E. Eakins
M.G. Norton
D.F. Bahr
Microstructural Effects in the Thermochromic Behavior of VO2/AI/Si Thin Film Heterostructures	42	(1)
K. Dovidenko
S. Beasor
A. Topol
H. Efstathiadis
S. Oktyabrsky
S. Shokhor
S. Naar
A.E. Kaloyeros
Influence of Pre-Gate Cleaning on Si/SiO2 Interface and Electrical Performance of CMOS Gate Oxide	43	(2)
X. Duan
K. Kisslinger
L. Mayes
S. Ruby
J. Barrett
Effect of Substrate Surface Structure and Deposition Conditions on the Microstructure of Tin Dioxide Thin Films Synthesized by Femtosecond Pulsed Laser Deposition	45	(2)
J.E. Dominguez
L. Fu
P.A. Van Rompay
Z.Y. Zhang
J.A. Nees
P.P. Pronko
X.Q. Pan
Characterization of Oxide Layers of Bulk Si1-xGex	47
W. Suzukake
S. Nemoto
T. Iida
Y. Takanashi
S. Sakuragi
METAL-OXIDE INTERFACES
In Situ TEM Analysis of Nanometre-Sized Oxide Precipitates in a Metal Matrix	1	(1)
Bart J. Kooi
Jeff Th.M. De Hosson
Electronic Structure and Bonding at the Al-Terminated Al(111)/α-Al2O3(0001) Interface: A First Principles Study	2	(1)
Donald J. Siegel
Louis G. Hector, Jr.
James B. Adams
Classical Interatomic Potential for Nb-Alumina Interfaces	3	(2)
K. Albe
R. Benedek
D.N. Seidman
R.S. Averback
Atomistic Simulation and Density Functional Analysis of Ni(111)-ZrO2(100)(Cubic) and NiO(111)-Ni(111)-ZrO2(100)(Cubic) Interfaces	5	(1)
Chang-Xin Guo
Donald E. Ellis
Vinayak P. Dravid
Luke Brewer
Non-Equilibrium Wetting at Aluminium-Sapphire Interfaces	6	(2)
George Levi
Wayne D. Kaplan
Semiempirical Correlation Between the Optical Band Gap of Oxides and Hydroxides and the Electronegativity of Their Constituents	8	(1)
Francesco Di Quarto
Monica Santamaria
Salvatore Piazza
Carmelo Sunseri
A Subnanoscale Study of Segregation at CdO/Ag(Au) Heterophase Interfaces	9	(1)
Jason T. Sebastian
Olof C. Hellman
David N. Seidman
Time Dependent Debonding of Aluminium/Alumina Interfaces Under Cyclic and Static Loading	10
J.J. Kruzic
J.M. McNaney
R.M. Cannon
R.O. Ritchie
SURFACES
Understanding Metal Oxide Surfaces at the Atomic Scale: STM Investigations of Bulk-Defect Dependent Surface Processes	1	(2)
Ulrike Diebold
Calculations of Perovskite Surface Relaxation	3	(5)
E. Heifets
E.A. Kotomin
R.I. Eglitis
R.E. Cohen
Exudation of Silicate Liquid From Polycrystalline Alumina	8	(2)
N. Ravishankar
Jeffrey K. Farrer
C. Barry Carter
Electronic Structure of Titanium Oxide Crystal Surface With Lithium Atom on the Surface	10
M. Oshikiri
F. Aryasetiawan
M. Boero
STRUCTURE-PROPERTY RELATIONSHIPS
Electrical Properties of Doped Tin Dioxide Thin Films Deposited Using Femtosecond Pulsed Laser Ablation	3	(1)
J.E. Dominguez
L. Fu
X.Q. Pan
Photochemical Reduction and Oxidation Reactions on Barium Titanate Surfaces	4	(2)
Jennifer L. Giocondi
Gregory S. Rohrer
Nanoporous Ceria Films Prepared From Colloidal Suspension	6	(1)
Vladimir Petrovsky
Brian Gorman
Harlan U. Anderson
Tatiana Petrovsky
Structure-Property Relationships of Tin Dioxide Thin Films Grown on Sapphire Substrates by Femtosecond Pulsed Laser Deposition	7	(3)
J.E. Dominguez
L. Fu
X.Q. Pan
Al Doped Ta2O5 Thin Films for Microelectronic Applications	10
P.C. Joshi
M.W. Cole
C.W. Hubbard
E. Ngo
Author Index
Subject Index