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9781558996885

Structure-Property Relationships of Oxide Surfaces and Interfaces II

by ; ; ; ;
  • ISBN13:

    9781558996885

  • ISBN10:

    1558996885

  • Format: Hardcover
  • Copyright: 2003-07-01
  • Publisher: Materials Research Society
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List Price: $31.99

Summary

Because surfaces and interfaces found in oxide systems are strikingly complex, they can only be fully understood when examined at an atomic level. Yet for the materials scientist, such understanding is of paramount importance since future technological advances require it. This book, the second in a new series from the Materials Research Society, addresses structure-property relationships in these systems. Compared to the first proceedings, here we see a shift towards less well-defined materials that often more closely resemble reality, and an increasing effort to study these phenomena using in situ techniques. Of particular interest are discussions on the dynamical evolution of surface structure and relationships between the structure of surfaces, their stoichiometry and the distribution of bulk dislocations, which in turn can control the growth and retraction of islands and pits. Modeling and characterization of thin intergranular films, with a focus on how these films influence the properties of so many ceramic materials, are also addressed.

Table of Contents

Prefacep. ix
Materials Research Society Symposium Proceedingsp. x
Ab-Initio Theory of Grain-Boundary Segregation in [alpha]-Alumina: Energetics, Atomistic and Electronic Structuresp. 1
Simulating Oxide Interfaces and Heterointerfacesp. 7
Segregation of Yttrium Ions as {2Y'[subscript Zr] : V[subscript O]}[superscript X] to the Surfaces of t-ZrO[subscript 2]p. 19
Orientation Dependence of Photochemical Reduction Reactions on SrTiO[subscript 3] Surfacesp. 25
Chromium and Lanthanum on Transition Alumina Surfaces: The Role of Bulk Point-Defect Distributions on Catalytic Activityp. 31
HRTEM Study of the Extended Defect Structure in Epitaxial Ba[subscript 0.3]Sr[subscript 0.7]TiO[subscript 3] Thin Films Grown on (001) LaAlO[subscript 3]p. 37
The Effect of the Surface Layer on the Dielectric Constant of (Pb, La)TiO[subscript 3] Thin Filmsp. 43
TEM Investigation of the Core/Cladding Interface of La[subscript 2]O[subscript 3]-Al[subscript 2]O[subscript 3]-SiO[subscript 2] Glasses for High Power Fiber Lasersp. 49
Characterization of Porous Pt/Al[subscript 2]O[subscript 3] Films Produced by Hybrid Gas-to-Particle Conversion and Chemical Vapor Depositionp. 55
Low Temperature Growth of Silicon Dioxide Thin Films by UV Photo-Oxidationp. 61
Correlation Between Microstructure, DC Resistivity and Magnetoresistance of SrRuO[subscript 3] Filmsp. 67
The Properties of a Na-Doped Twist Boundary in SrTiO[subscript 3] From First Principlesp. 73
The Effect of Y on the Strength of FeCrAl Alloy/Sapphire Interfacesp. 79
Effect of Thin Y-O and Si-O Films on In Situ Formed CaO Coatings on V-4%Cr-4% Ti in Liquid 2.8 at.% Ca-Lip. 85
Effect of Lanthanum Manganite Modification by Calcium and/or Fluorine on the Bonding Strength, Mobility and Reactivity of the Lattice and Surface Oxygenp. 91
Study of Pore Architecture in Silicon Oxide Thin Films by Variable-Energy Positron Annihilation Spectroscopyp. 97
The Effect of Changing Epitaxial Strain on Colossal Magnetoresistance Thin Filmsp. 103
Stabilization of Indium Tin Oxide Films to Very High Temperaturesp. 109
Oxide Structures Formed on Silver Single Crystals Due to Hyperthermal Atomic Oxygen Exposurep. 115
Surface Chemistry of Mesoporous Materials: Effect of Nanopore Confinementp. 121
A Structural Comparison of Si(100) Oxidized by Atomic and Molecular Oxygenp. 127
Metalorganic Chemical Vapor Deposition of Aluminum Oxide on Silicon Nitridep. 133
Influence of Structure and Chemistry on Piezoelectric Properties of PZT in a MEMS Power Generation Applicationp. 139
Observations of TiO[subscript 2] Surfaces Using Totally Reflected X-ray In-Plane Diffraction Under UV Irradiationp. 145
Phase and Morphology in Mixed CuO-WO[subscript 3] Films for Chemical Sensingp. 149
Surface Electrical Measurements of Photo-Catalysis on Rutile TiO[subscript 2](110)p. 155
Chemical Structure of N Atoms Incorporated Into 1 nm-Thick SiO[subscript 2]/Si as Revealed With the Dissolution and Hydrogenation in Hydrofluoric Acidp. 161
Adsorption of Water Molecules on the Surface of Photo-Catalyst: A First Principles Theoretical Comparison Between InVO[subscript 4] and Rutile TiO[subscript 2]p. 167
Direct Determination of the Stacking Order in Gd[subscript 2]O[subscript 3] Epi-Layers on GaAsp. 173
Grain Boundary Segregation in Titanium Dioxide: Evaluation of Relative Driving Forces for Segregationp. 179
Molecular Dynamics Computer Simulations of Calcium-Alumino-Silicate Intergranular Films Between the Basal and Prism Planes of [alpha]-Al[subscript 2]O[subscript 3]p. 191
Effects of the Amorphous Oxide Intergranular Layer Structure and Bonding on the Fracture Toughness of a High Purity Silicon Nitridep. 201
Electrochemical Properties of Copper Oxide Surfaces, Buried Interfaces, and Subsurface Zones and Their Use to Characterize These Entitiesp. 207
Interface Conduction between Conductive ReO[subscript 3] Thin Film and NdBa[subscript 2]Cu[subscript 3]O[subscript 6] Thin Filmp. 213
Author Indexp. 219
Subject Indexp. 221
Table of Contents provided by Ingram. All Rights Reserved.

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