Surface Analysis The Principal Techniques

by Vickerman, John C.; Gilmore, Ian S.

• ISBN13: 9780470017647
• ISBN10: 0470017643
• Edition: 2nd
• Format: Paperback
• Copyright: 2009-04-27
• Publisher: Wiley

Summary

This completely updated and revised second edition of Surface Analysis: The Principal Techniques, deals with the characterisation and understanding of the outer layers of substrates, how they react, look and function which are all of interest to surface scientists. Within this comprehensive text, experts in each analysis area introduce the theory and practice of the principal techniques that have shown themselves to be effective in both basic research and in applied surface analysis.Examples of analysis are provided to facilitate the understanding of this topic and to show readers how they can overcome problems within this area of study.

Author Biography

John C. Vickerman BSc in Chemistry (Edinburgh), Ph.D. in Surface Chemistry (Bristol), DSc (Bristol). Predoctoral fellowships at the Universities of Perugia and Rome, postdoctoral fellowships at the University of Bristol and the Technical University of Eindhoven. Sabbatical study periods at the University of Munich, the Free University of Berlin and Pennsylvania State University.

Dr Ian Gilmore, Surface and Nano-Analysis, National Physical Laboratory, Teddington, UK
Ian is a Principal Research Scientist in the Surface and Nano-Analysis Research team and joined NPL in 1991. His research has a focus on the analysis of complex molecules at surfaces. Recent research has led to the development of a novel new variant of static static SIMS called gentle-SIMS or G-SIMS,
He received a degree in Physics from the University of Manchester in 1991 and a PhD from the University of Loughborough in 2000. Ian is a Fellow of the Institute of Physics a member of the EPSRC College and a member of the American Vacuum Society.

Table of Contents

List of Contributors

Preface

Introduction

How do we Define the Surface?

How Many Atoms in a Surface?

Information Required

Surface Sensitivity

Radiation Effects Surface Damage

Complexity of the Data

Auger Electron Spectroscopy

Introduction

Principle of the Auger Process

Instrumentation

Quantitative Analysis

Depth Profile Analysis

Summary

References

Problems

Electron Spectroscopy for Chemical Analysis

Overview

X-ray Interaction with Matter, the Photoelectron Effect and Photoemission from Solids

Binding Energy and the Chemical Shift

Inelastic Mean Free Path and Sampling Depth

Quantification

Spectral Features

Instrumentation

Spectral Quality

Depth Profiling

XY Mapping and Imaging

Chemical Derivatization

Valence Band

Perspectives

Conclusions

Acknowledgements

References

Problems

Molecular Surface Mass Spectrometry by SIMS

Introduction

Basic Concepts

Experimental Requirements

Secondary Ion Formation

Modes of Analysis

Ionization of the Sputtered Neutrals

Ambient Methods of Desorption Mass Spectrometry

References

Problems

Dynamic SIMS

Fundamentals and Attributes

Areas and Methods of Application

Quantification of Data

Novel Approaches

Instrumentation

Conclusions

References

Problems

Low-Energy Ion Scattering and Rutherford Backscattering

Introduction

Physical Basis

Rutherford Backscattering

Low-Energy Ion Scattering

Acknowledgement

References

Problems

Key Facts

Vibrational Spectroscopy from Surfaces

Introduction

Infrared Spectroscopy from Surfaces

Electron Energy Loss Spectroscopy (EELS)

The Group Theory of Surface Vibrations

Laser Raman Spectroscopy from Surfaces

Inelastic Neutron Scattering (INS)

Sum-Frequency Generation Methods

References

Problems

Surface Structure Determination by Interference Techniques

Introduction

Electron Diffraction Techniques

X-ray Techniques

Photoelectron Diffraction

References

Scanning Probe Microscopy

Introduction

Scanning Tunnelling Microscopy

Atomic Force Microscopy

Scanning Near-Field Optical Microscopy

Other Scanning Probe Microscopy Techniques

Lithography Using Probe Microscopy Methods

Conclusions

References

Problems

The Application of Multivariate Data Analysis Techniques in Surface Analysis

Introduction

Basic Concepts

Factor Analysis for Identification

Regression Methods for Quantification

Methods for Classification

Summary and Conclusion

Acknowledgements

References

Problems

Vacuum Technology for Applied Surface Science

Introduction: Gases and Vapours

The Pressure Regions of Vacuum Technology and their Characteristics

Production of a Vacuum

Measurement of Low Pressures

Acknowledgement

References

Units, Fundamental Physical Constants and Conversions

Base Units of the SI

Fundamental Physical Constants

Other Units and Conversions to SI

References

Index

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