Taguchi Methods for Robust Design

by Wu, Yuin; Wu, Alan

• ISBN13: 9780791801574
• ISBN10: 0791801578
• Format: Hardcover
• Copyright: 2000-06-01
• Publisher: Amer Society of Mechanical

Table of Contents

List of Figures	xi
List of Tables	xiii
Foreword	xvii
Preface	xix
Introduction
What is Quality Engineering?	1	(2)
Quality Engineering and Experimental Design	3	(2)
Interactions and Orthogonal Arrays	5	(4)
Robust Technology Development	9	(4)
What is a Signal-to-Noise Ratio?	13	(1)
Where Can SN Ratios Be Used?	14	(3)
Concept of SN Ratios	17	(2)
Benefits of Using SN Ratios	19	(4)
Inverse Proportionality to the Loss Function	20	(1)
Simplification of Direct Product Design	20	(1)
Simplifies Attainment of Robust Design	20	(1)
Simplification of Adjustments or Calibrations	21	(1)
Efficient Evaluations for Measuring Systems	21	(1)
Reduction of Product-Development Cycle Time	22	(1)
Research Applies to a Group of Products (Robust Technology Development)	22	(1)
Simple Examples	23	(5)
An Example of a Measurement System	23	(2)
An Example of an Extrusion Process	25	(3)
Parameter Design	28	(5)
Layout of Orthogonal Arrays for Parameter Design	33	(6)
Types of SN Ratios
Introduction	39	(1)
Classification Based on the Type of Data	39	(2)
Attribute-Type Data is not Fully Informative	40	(1)
Attribute-Type Data is Inefficient	40	(1)
Using Attribute-Type Data may Lead to Interactions	40	(1)
Classification Based on Intention	41	(2)
Classification Based on Input and Output	43	(1)
Other Ways of Classifying SN Ratios	43	(1)
How to Select SN Ratios	44	(2)
Ideal Function	46	(3)
Basic Dynamic-Type SN Ratios for Continuous Variables
Introduction	49	(1)
Zero-Point Proportional Equation	49	(5)
Reference-Point Proportional Equation	54	(5)
Linear Equation	59	(6)
Linear Equation Using a Tabular Display of the Orthogonal Polynomial Equation	65	(4)
Numerically Controlled (NC) Machine Processing	69	(28)
Introduction	69	(2)
Experiment and Analysis Using Signal-to-Noise Ratio	71	(5)
Interpretation and Prediction	76	(1)
The Confirmation Run	77	(20)
Various Cases
Estimation of Noise	97	(4)
Case with an Adjustment Factor	101	(12)
Case (I) With Double Signals	113	(5)
Case (II) With Double Signals	118	(4)
Case When Signal-Factor Levels are Different at Different Runs of an Orthogonal Array	122	(2)
Split-Type Analysis	124	(13)
What is Split-Type Analysis?	124	(1)
Split-Type Analysis for Two-Level Orthogonal Arrays	125	(7)
Split-Type Analysis for Mixed-Type Orthogonal Arrays	132	(5)
Custom-Written SN Ratios	137	(10)
Chemical Reaction I	137	(2)
Chemical Reaction II	139	(1)
Dynamic Operating Window	140	(6)
Optimization of Performance	146	(1)
Case When True Values of Signal Factor are Unknown	147	(16)
Case When Level Interval of Signal Factor is Known	147	(6)
Case When Level Ratio is Known	153	(5)
Case When Signal-Factor Variance is Used	158	(5)
Nondynamic SN Ratios
Introduction	163	(4)
Nominal-is-Best Application	167	(8)
Case 1: Non-Negative Data	168	(5)
Case 2: Positive and Negative Data	173	(2)
Smaller-is-Better Application	175	(1)
Larger-is-Better Application	176	(1)
Nondynamic Operating Window	177	(10)
Classified Attributes
Difference Between Continuous Variables and Classified Attributes	187	(4)
Wasted Information	187	(1)
Inefficiency	188	(1)
Interactions	188	(3)
What are the Strategies to Avoid Interactions?	191	(1)
Case With Two Classes, One Type of Mistake	192	(4)
Case With Two Classes, Two Types of Mistakes	196	(11)
Examples	196	(4)
Determination of the Standard Rate of Mistakes	200	(1)
Standard SN Ratio	201	(5)
Comparison of Screening Machines	206	(1)
Air-Separation Process	207	(4)
Case With Two Classes Where True Values of Signal Factors are Unknown	211	(3)
Case With Three or More Classes Where True Values of Signal Factors are Known	214	(5)
Equations for Calculation	214	(2)
Beer-Taste Recognition	216	(3)
Case With Three or More Classes Where True Values of Signal Factors are Unknown	219	(4)
Case With Three or More Classes Without a Signal Factor (Classes Have an Order)	223	(2)
SN Ratio With Complex Numbers
The Ideal Function of Electric Circuits	225	(1)
SN Ratio for Complex Numbers	226	(4)
The Hermitian Form	230	(6)
Development of a Filter Circuit	236	(15)
Explanation of the System	236	(1)
The Ideal Function	237	(1)
Target Frequency Characteristic	238	(1)
Factors, Levels, and Layout	238	(3)
Calculation	241	(4)
Optimum Condition and Estimation	245	(1)
Tuning	246	(5)
Layout and Analysis of Youden Squares
Purpose of Using Youden Squares	251	(2)
Calculation of Main Effects	253	(2)
Numerical Example	255	(3)
Derivation	258	(3)
Incomplete Data
Introduction	261	(2)
Treatment of Incomplete Data	263	(4)
Sequential Approximation	267	(4)
Procedures	267	(1)
Numerical Example	267	(4)
Robust Technology Development
Introduction	271	(1)
Examples	272	(1)
Development of Hardness Standards	272	(1)
Development of a Braking System	272	(1)
Development of Ammunition	273	(1)
Paradigm Shift Needed: Development of Quality Must Begin in R&D	273	(1)
How Robust Technology Development Works: The Main Concepts	274	(7)
Two-Step Optimization: Reduce Variability First, Then Place on Target	274	(1)
Choice of Right Output to Measure	275	(1)
To Get Quality, Don't Measure Quality!	276	(1)
Energy Transformation and Definition of Ideal Function	277	(3)
SN Ratio	280	(1)
Advantages of Using Robust Technology Development	281	(2)
Technology Readiness	281	(1)
Flexibility	282	(1)
Reproducibility	283	(1)
How Far Advanced is Robust Technology Development?	283	(2)
Case Studies
Introduction	285	(1)
Mechanical Industry	286	(16)
Electrical Industry	302	(9)
Chemical Industry	311	(6)
Glossary	317	(10)
References	327	(4)
Index	331	(4)
Biographies
Yuin Wu	335	(1)
Alan Wu	336