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Test and Diagnosis for Small-delay Defects

by Tehranipoor, Mohammad; Peng, Ke; Chakrabarty, Krishnendu

ISBN13: 9781441982964
ISBN10: 1441982965
Format: Hardcover
Copyright: 2011-09-27
Publisher: Springer Verlag

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1. Test and Diagnosis for Small-delay Defects > ISBN13: 9781441982964

List Price: $169.99

Summary

This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.

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Rent More, Save More! Use code: ECRENTAL

Rent More, Save More! Use code: ECRENTAL

5% off 1 book, 7% off 2 books, 10% off 3+ books

Test and Diagnosis for Small-delay Defects

Summary

Supplemental Materials

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