The Keep It Simple (KISS) philosophy is the primary focus of this book. It is written in very simple language with minimal math, as a compilation of helpful EMI troubleshooting hints. Its light-hearted tone is at odds with the extreme seriousness of most engineering reference works that become boring after a few pages. This text tells engineers what to do and how to do it. Only a basic knowledge of math, electronics, and a basic understanding of EMI/EMC are necessary to understand the concepts and circuits describedOnce EMC troubleshooting is demystified, readers learn there are quick and simple techniques to solve complicated problems a key aspect of this book. Simple and inexpensive methods to resolve EMI issues are discussed to help generate unique ideas and methods for developing additional diagnostic tools and measurement procedures. An appendix on how to build probes is included. It can be a fun activity, even humorous at times with bizarre techniques (i.e., the sticky finger probe)

MARK I. MONTROSE is an expert in the fields of regulatory compliance, electromagnetic compatibility (EMC) and product safety. He has performed extensive research in the areas of EMC theory and signal integrity, and has written numerous papers on the subjects. Mr. Montrose is also a Senior Member of the IEEE and a member of the Board of Directors of both the IEEE EMC and Product Safety Engineering Society, as well as an active participant in local, national, and international activities of both Societies. He has published two prior books related to EMC and printed circuit boards.

EDWARD M. NAKAUCHI has over thirty years of experience in analog, power, and digital design and has spent the majority of the past twenty years working in the EMI/EMC/EMP and ESD areas for military aerospace companies as well as commercial audio, computer, and medical organizations. He has written numerous technical papers and magazine articles, and presented seminars on various EMI/EMP/ESD topics. He has also taught courses on EMI/EMC through the University of California Irvine Extension program. He is a NARTE certified EMC/ESD engineer and an IEEE Senior Member.

Preface	p. xiii
Acknowledgments	p. xvii
Introduction	p. 1
The Need to Comply	p. 1
Definitions	p. 3
Nature of Interference	p. 5
Overview on Product Testing	p. 6
Test Environment	p. 6
Self-Compatibility	p. 8
Validation of Measured Data	p. 9
Problems during Emissions Testing	p. 10
Time-Domain versus Frequency-Domain Analysis	p. 12
EMC Testing Methodologies	p. 14
Development Testing and Diagnostics	p. 15
Compliance and Precompliance Testing	p. 15
References	p. 16
Electric, Magnetic, and Static Fields	p. 17
Relationship between Electric and Magnetic Fields	p. 17
Methods of Noise Coupling	p. 22
Common-Impedance Coupling	p. 24
Electromagnetic Field Coupling	p. 25
Conductive Coupling	p. 27
Radiated Coupling-Magnetic Field	p. 27
Radiated Coupling-Electric Field	p. 28
Radiated and Conducted Coupling Combined	p. 31
Common-Mode Currents versus Differential-Mode Currents	p. 32
Differential-Mode Currents	p. 32
Common-Mode Currents	p. 33
Example on Difference between Differential- and Common-Mode Currents	p. 33
Radiation due to Differential-Mode Currents	p. 36
Common-Mode Radiation	p. 38
Conversion between Differential- and Common-Mode Energy	p. 39
Static Fields	p. 40
Electrostatic Discharge Waveforms	p. 41
Triboelectric Series	p. 41
Failure Modes From a Static Event	p. 43
References	p. 46
Instrumentation	p. 47
Time-Domain Analyzer (Oscilloscope)	p. 47
Oscilloscope Probes	p. 52
Frequency-Domain Analyzers	p. 53
Spectrum Analyzers	p. 57
Receivers	p. 64
Precompliance versus Compliance Analyzers	p. 66
Correlation Analyzer	p. 68
Characteristics of Cancellation System	p. 70
Coherence Factor	p. 71
References	p. 75
Test Facilities	p. 77
Open-Area Test Sites	p. 78
Requirements for an OATS	p. 78
Test Configuration--System, Power, and Cable Interconnects	p. 85
Operating Conditions	p. 87
Measurement Precautions	p. 95
Alternate Test Sites	p. 95
Chambers	p. 96
Anechoic Chamber	p. 97
Screen/Shield Rooms	p. 104
Reverberation Chamber	p. 107
Cells	p. 109
TEM Cell	p. 109
GTEM Cell	p. 110
References	p. 112
Probes, Antennas, and Support Equipment	p. 113
Need for Probes, Antennas, and Support Equipment	p. 113
Voltage Probes	p. 115
Current Probes	p. 116
Specifying a Current Probe	p. 118
Limitations When Using Current Probes	p. 122
LISN/AMN (AC Mains)	p. 124
CDNs (Data and Signal Lines)	p. 128
Absorbing Clamp	p. 130
Test Setup and Measurement Procedure	p. 132
Bulk Current Injection--Probe and Insertion Clamp	p. 134
Choosing a BCI Probe	p. 135
Basic Probe Types--Near Field and Closed Field	p. 137
Sniffer Probes	p. 140
Near-Field Probes	p. 142
Commercial Probes	p. 143
Differential-Mode Probes	p. 143
Home-Made Probes	p. 146
Alternate Troubleshooting Devices	p. 147
Far-Field Antennas	p. 150
Common Antennas Used for EMC Testing	p. 153
References	p. 156
Conducted Testing	p. 157
Overview of Conducted Currents	p. 157
Common- and Differential-Mode Currents on Wires and Cables	p. 159
Coupling Paths for Conducted Emissions	p. 161
Conducted Emissions Test Requirements	p. 163
Performing Conducted Current Tests	p. 163
Engineering Investigation in Laboratory or Engineer's Office	p. 163
Test Environment	p. 164
Conducted Emissions Testing (AC Power Mains)	p. 164
Potential Problems during Conducted Emission Testing	p. 166
In Situ Testing of Systems and Installations	p. 167
Immunity/Susceptibility Tests	p. 168
Electrical Fast Transient and Burst Testing	p. 169
Surges	p. 174
Conducted RF Current Immunity	p. 181
Coupling Methods	p. 181
Typical Conducted Immunity Test Setup and Equipment	p. 184
Performing Typical Conducted Immunity Test	p. 189
Diagnosis and Fixes	p. 191
AC Mains Supply Dips, Dropouts, and Interruptions	p. 192
AC Mains Supply Sags/Brownouts	p. 195
Swell Testing	p. 196
Three-Phase Equipment--Compliance Testing	p. 198
Diagnosis and Fixes	p. 198
Power Line Harmonics	p. 199
How Harmonics Are Created and Related Concerns	p. 200
Diagnosis and Fixes	p. 211
Voltage Fluctuation and Flicker	p. 211
Description of Short-Term Flicker	p. 212
Instrumentation	p. 213
References	p. 215
Radiated Testing	p. 217
Performing Radiated Tests	p. 218
Engineering Investigation in Laboratory or Engineer's Office	p. 220
Precompliance Testing	p. 220
Performing Precompliance Analysis	p. 223
Formal EMC Qualification Tests	p. 224
Instrumentation Error	p. 225
In Situ Testing of Systems and Installations	p. 227
Immunity/Susceptibility Tests	p. 228
Radiated Immunity	p. 229
Modulation	p. 231
Harmonic Issues	p. 233
Monitoring of Immunity Field Level	p. 234
Electrostatic Discharge	p. 234
General Information	p. 235
ESD Waveforms	p. 235
Triboelectric Series	p. 236
Typical Test Setup	p. 237
EUT Performance Criteria	p. 241
Diagnosis and Fixes	p. 241
Concerns Related to Analyzing ESD Events	p. 242
Alternative ESD Test Simulator	p. 243
Other Uses for ESD Simulator	p. 244
Sensing ESD Events within One's Environment	p. 245
Power Frequency Magnetic Field Disturbance	p. 245
General Conditions	p. 246
EUT Performance Criteria	p. 246
Typical Test Setup	p. 247
Waveform Verification	p. 249
Performing the Test	p. 249
References	p. 250
General Approaches to Troubleshooting	p. 251
General System Testing and Troubleshooting	p. 252
Emission Testing	p. 253
Immunity Testing	p. 255
In Situ Testing	p. 256
Potential Problems During Testing and Troubleshooting	p. 259
Testing and Troubleshooting Concerns	p. 263
Systematic Approach for Emission Testing and Troubleshooting	p. 264
Systematic Approach for Immunity Testing and Troubleshooting	p. 266
Systematic Approach to Detecting and Locating Problems	p. 267
Minimum Requirements for Performing EMC Tests	p. 271
Repeatability of System Testing	p. 272
Unexpected Problems after Production Has Begun	p. 275
Creative Approaches to Troubleshooting (Case Studies)	p. 276
References	p. 277
On-Site Troubleshooting Techniques	p. 279
Quick Fixes and Solutions	p. 280
Conducted Solutions	p. 281
Radiated Solutions	p. 287
Crosstalk Solutions	p. 291
Simplified Troubleshooting Techniques	p. 292
The "Plain Wave and Standing Wave" Technique	p. 293
The "Disabling-the-System" Technique	p. 293
The "Cable Disconnection" Technique	p. 294
The "Sticky Finger" Debugging Tool	p. 295
The "Sharpen-Your-Pencil" Tool	p. 296
The "Coolant Spray" Tool	p. 297
The "Piece-of-Wire" Approach	p. 298
The "Radio Control Race Car Diagnostic Sensor	p. 298
The "Tin Can Wireless Antenna" for Signals above 1 GHz	p. 300
Testing and Troubleshooting Using Probes	p. 301
Using Probes for Immunity Testing and Troubleshooting	p. 301
Differential Measurement of RF Currents on Cables and Interconnects	p. 305
Switching Power Supply Effects on Common-Mode Conducted Noise	p. 308
Discrete Component Diagnostic Tool	p. 310
Tweezers Probe	p. 311
Miniature High-Discrimination Probe	p. 312
Using Current Probe as Substitute for Radiated Emission Testing	p. 313
Enclosure Resonances and Shielding Effectiveness	p. 315
Alternate Troubleshooting Techniques	p. 316
Using Oscilloscope to Debug Signal Integrity Waveforms and Radiated Emissions	p. 316
Using Inexpensive Receivers for Emissions Testing	p. 319
Using Amateur Radio Transmitter for Immunity Testing	p. 321
Radiated Problem Masked as Conducted Emission Problem	p. 322
Determining Whether Conducted Emission Noise is Differential Mode or Common Mode	p. 323
Another Use of EFT/B Generator	p. 324
Signal Integrity Observations	p. 325
System-Level Troubleshooting	p. 326
Switching Power Supplies--Measuring Magnetic Field Coupling	p. 326
Potential Problems When Using Ferrite Cores--Increase in Radiated Emissions	p. 328
Measuring Shielding Effectiveness of Materials and Enclosures	p. 330
Measuring Effects of High-Frequency Noise Currents in Equipment	p. 333
Measuring Noise Voltage across Seams in Enclosures	p. 336
Ambient Cancellation or Suppression	p. 339
Printed Circuit Board Diagnostic Scanners	p. 341
References	p. 345
Building Probes	p. 347
Test Procedures	p. 375
Glossary	p. 435
Bibliography	p. 447
Index	p. 453
About the Authors	p. 459
Table of Contents provided by Ingram. All Rights Reserved.

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