Transmission Electron Microscopy

by David B. Williams; C. Barry Carter

• ISBN13: 9780306452475
• ISBN10: 0306452472
• Format: Nonspecific Binding
• Copyright: 2013-03-09
• Publisher: Springer Nature

Summary

This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.

Table of Contents

Basics

The Transmission Electron Microscope

Scattering and Diffraction

Elastic Scattering

Inelastic Scattering and Beam Damage

Electron Sources

Lenses, Apertures, and Resolution

How to `See' Electrons

Pumps and Holders

The Instrument

Specimen Preparation. Diffraction

Diffraction Patterns

Thinking in Reciprocal Space

Diffracted Beams

Bloch Waves

Dispersion Surfaces

Diffraction from Crystals

Diffraction from Small Volumes

Indexing Diffraction Patterns

Kikuchi Diffraction

Obtaining CBED Patterns

Using Covergent-Beam Technologies. Imaging

Imaging in the TEM

Thickness and Bending Effects

Planar Defects

Strain Fields

WeakBeam Dark-Field Microscopy

Phase-Contrast Images

High-Resolution TEM

Image Simulation

Quantifying and Processing HRTEM Images

Other Imaging Techniques. Spectrometry

Xray Spectrometry

The XEDS-TEM Interface

Qualitative Xray Analysis

Quantitative Xray Microanalysis

Spatial Resolution and Minimum Detectability

Electron EnergyLoss Spectrometers

The EnergyLoss Spectrum

Microanalysis with Ionization-Loss Electrons

Everything Else in the Spectrum

Index

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