Transmission Electron Microscopy and Diffractometry of Materials

by Fultz, Brent; Howe, James M.

• ISBN13: 9783540738855
• ISBN10: 3540738851
• Edition: 3rd
• Format: Hardcover
• Copyright: 2007-12-04
• Publisher: Springer Verlag

Summary

This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

Table of Contents

Diffraction and the X-ray powder diffractometer	p. 1
The TEM and its optics	p. 61
Scattering	p. 119
Inelastic electron scattering and spectroscopy	p. 163
Diffraction from crystals	p. 223
Electron diffraction and crystallography	p. 273
Diffraction contrast in TEM images	p. 337
Diffraction lineshapes	p. 423
Patterson functions and diffuse scattering	p. 457
High-resolution TEM imaging	p. 517
High-resolution STEM imaging	p. 583
Dynamical theory	p. 611
Bibliography	p. 677
Appendix	p. 691
Index	p. 745
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