Applications and Metrology at Nanometer Scale 1 Smart Materials, Electromagnetic Waves and Uncertainties book cover, ISBN 9781786306401

Applications and Metrology at Nanometer Scale 1 Smart Materials, Electromagnetic Waves and Uncertainties

by Dahoo, Pierre-Richard; Pougnet, Philippe; El Hami, Abdelkhalak
  • ISBN13: 9781786306401
  • ISBN10: 1786306409
  • eBook ISBN(s): 9781119808145
  • Edition: 1st
  • Format: Hardcover
  • Copyright: 2021-03-16
  • Publisher: Wiley-ISTE
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