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Characterisation of Nanomaterials Using Transmission Electron Microscopy | |
Introduction | p. 1 |
Imaging | p. 3 |
Transmission Electron Microscopy | p. 3 |
High-Resolution Electron Microscopy | p. 3 |
Basis of High-Resolution Imaging | p. 5 |
Resolution Limits | p. 7 |
Lattice Imaging or Atomic Imaging | p. 9 |
Instrumental Parameters | p. 9 |
Survey of Applications | p. 10 |
Developments in HREM | p. 10 |
Small Particles and Precipitates | p. 12 |
Two-Dimensional Objects | p. 13 |
One-Dimensional Objects | p. 14 |
Zero-Dimensional Objects | p. 15 |
Surfaces and Interfaces | p. 16 |
Emerging Trends and Practical Concerns | p. 18 |
Atomic Location and Quantitative Imaging | p. 18 |
Detection and Correction of Aberrations | p. 19 |
The Stobbs' Factor | p. 22 |
Radiation Damage | p. 22 |
Prospects | p. 24 |
Acknowledgments | p. 24 |
References | p. 24 |
Scanning Transmission Electron Microscopy | |
Introduction | p. 28 |
Basic Description | p. 29 |
Detectors | p. 30 |
Electron Energy-loss Spectroscopy | p. 31 |
Aberration Corrected STEM | p. 35 |
The Aberration Function | p. 35 |
Spherical and Chromatic Aberration | p. 36 |
Aberration Correctors | p. 38 |
What Do We See in a Stem? | p. 39 |
Measuring Aberrations | p. 45 |
Phonons | p. 46 |
Resolution | p. 47 |
Three-Dimensional Microscopy | p. 48 |
Channeling | p. 50 |
Applications to Nanostructure Characterisation in Catalysis | p. 51 |
Anomalous Pt-Pt Distances in Pt/alumina Catalytic Systems | p. 51 |
La Stabilisation of Catalytic Supports | p. 53 |
CO Oxidation by Supported Noble-Metal Nanoparticles | p. 56 |
Summary and Outlook | p. 59 |
Acknowledgements | p. 60 |
References | p. 60 |
Scanning Tunneling Microscopy of Surfaces and Nanostructures | |
History of the STM | p. 66 |
The Tunneling Interaction and Basic Operating Principles of STM | p. 67 |
Atomic-Resolution Imaging of Surface Reconstructions | p. 70 |
Imaging of Surface Nanostructures | p. 74 |
Manipulation of Adsorbed Atoms and Molecules | p. 78 |
Influence of the Surface Electronic States on STM Images | p. 83 |
Tunneling Spectroscopy | p. 86 |
Tip Artefacts in STM Imaging | p. 88 |
Conclusions | p. 90 |
References | p. 91 |
Electron Energy-loss Spectroscopy and Energy Dispersive X-Ray Analysis | |
What is Nanoanalysis? | p. 94 |
Nanoanalysis in the Electron Microscope | p. 95 |
General Instrumentation | p. 96 |
X-Ray Analysis in the TEM | p. 99 |
Basics of X-Ray Analysis | p. 99 |
Analysis and Quantification of X-Ray Emission Spectra | p. 102 |
Application to the Analysis of Nanometre Volumes in the S/TEM | p. 104 |
Related Photon Emission Techniques in the TEM | p. 108 |
Basics of EELS | p. 108 |
Instrumentation for EELS | p. 108 |
Basics of the EEL Spectrum | p. 112 |
Quantification of EELS - The Determination of Chemical Composition | p. 116 |
Determination of Electronic Structure and Bonding | p. 118 |
Application to the Analysis of Nanometre Volumes in the S/TEM | p. 127 |
EELS Imaging | p. 131 |
Radiation Damage | p. 133 |
Emerging Techniques | p. 135 |
Conclusions | p. 136 |
References | p. 136 |
Electron Holography of Nanostructured Materials | |
Introduction | p. 138 |
Basis of Off-Axis Electron Holography | p. 139 |
Experimental Considerations | p. 143 |
The Mean Inner Potential Contribution to the Phase Shift | p. 144 |
Measurement of Magnetic Fields | p. 146 |
Early Experiments | p. 146 |
Experiments Involving Digital Acquisition and Analysis | p. 146 |
Measurement of Electrostatic Fields | p. 162 |
Electrically Biased Nanowires | p. 162 |
Dopant Potentials in Semiconductors | p. 164 |
Space-Charge Layers at Grain Boundaries | p. 170 |
High-Resolution Electron Holography | p. 171 |
Alternative Forms of Electron Holography | p. 173 |
Discussion, Prospects for the Future and Conclusions | p. 175 |
Acknowledgements | p. 177 |
References | p. 177 |
Electron Tomography | |
Introduction | p. 184 |
Theory of Electron Tomography | p. 187 |
From Projections to Reconstructions | p. 187 |
Backprojection: Real-Space Reconstruction | p. 191 |
Constrained Reconstructions | p. 192 |
Reconstruction Resolution | p. 196 |
Measuring Reconstruction Resolution | p. 197 |
The Projection Requirement | p. 198 |
Acquiring Tilt Series | p. 200 |
Instrumental Considerations | p. 201 |
Specimen Support and Positioning | p. 204 |
Specimen Considerations | p. 204 |
Alignment of Tilt Series | p. 208 |
Alignment by Tracking of Fiducial Markers | p. 210 |
Alignment by Cross-Correlation | p. 210 |
Rotational Alignment without Fiducial Markers | p. 213 |
Other Markerless Alignment Techniques | p. 218 |
Visualisation, Segmentation and Data Mining | p. 218 |
Visualisation Techniques | p. 218 |
Segmentation | p. 221 |
Quantitative Analysis | p. 224 |
Imaging Modes | p. 225 |
Bright-Field TEM | p. 225 |
Dark-Field (DF) Tomography | p. 234 |
HAADF STEM | p. 236 |
Meeting the Projection Requirement | p. 237 |
Experimental Considerations | p. 238 |
Limitations | p. 242 |
Core-Loss (Chemical Mapping) EFTEM | p. 246 |
Low-Loss EFTEM | p. 252 |
Energy Dispersive X-Ray (EDX) Mapping | p. 252 |
Holographic Tomography | p. 254 |
New Techniques | p. 254 |
Electron Energy-Loss Spectroscopy (EELS) Spectrum Imaging | p. 254 |
Confocal STEM | p. 255 |
Atomistic Tomography | p. 256 |
Conclusions | p. 259 |
References | p. 259 |
In-situ Environmental Transmission Electron Microscopy | |
Introduction | p. 268 |
Background | p. 269 |
Recent Advances in Atomic-Resolution In-Situ ETEM | p. 270 |
Impact of Atomic-Resolution In-Situ ETEM and Applications | p. 273 |
Applications of Atomic-Resolution In-Situ ETEM to Studies of Gas-Catalyst and Liquid-Catalyst Reactions | p. 274 |
Liquid-Phase Hydrogenation and Polymerisation Reactions | p. 274 |
Development of Nanocatalysts for Novel Hydrogenation Chemistry and Dynamic Imaging of Desorbed Organic Products in Liquid-Phase Reactions | p. 275 |
Butane Oxidation Technology | p. 278 |
In-Situ Observations of Carbon Nanotubes in Chemical and Thermal Environments | p. 284 |
Conclusions | p. 287 |
Acknowledgements | p. 288 |
References | p. 288 |
Subject Index | p. 291 |
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The Used, Rental and eBook copies of this book are not guaranteed to include any supplemental materials. Typically, only the book itself is included. This is true even if the title states it includes any access cards, study guides, lab manuals, CDs, etc.