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9780444897701

Metrology at the Frontiers of Physics and Technology : Proceedings of the International School of Physics "Enrico Fermi," 27 June-7 July, 1989

by ;
  • ISBN13:

    9780444897701

  • ISBN10:

    0444897704

  • Format: Hardcover
  • Copyright: 1992-10-01
  • Publisher: Elsevier Science Ltd

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Summary

The spectroscopy of trapped ions or laser-cooled atoms offers the prospect of visible frequency standards to match or even exceed the accuracy of the caesium standard. The development of satellite methods for time comparisons has improved by more than an order of magnitude the accuracy with which national laboratories can routinely compare their clocks. Mechanical metrology has not been left behind. Driven by the need to improve manufacturing technology, major advances have taken place in computer control machining and mechanical measuring systems. These, and many other fascinating developments in the field of metrology are presented in this book.

Table of Contents

Foreword
Gruppo fotografico dei partecipanti al Corso
The evolution of metrology during the last decade. Introduction to the course "Metrology at the Frontiers of Physics and Technology"
Uncertainty and error in physical measurements
The continuing evolution in the definitions and realizations of the SI units of measurement
Quantum electrodynamics and fundamental constants
Experiments on gravitation
Metrology and the logical structure of physics
Detectors of gravitational waves
Experiments on the "fifth force"
Recent advances in mass standards and weighing and perspectives for a new definition of the kilogram
The quantum Hall effect
Design and operation of series-array Josephson voltage standards
The development of the International Temperature Scale of 1990
The metrology of temperature below 1 K.
Cryogenic radiometry
Laser cooling of atoms and ion trapping for frequency standards
Laser frequency stabilization and measurement
Time scales
Atomic time scales
Metrological aspects of fundamental astronomy
Metrology applications of STM, AFM and X-ray interferometry
High-precision manufacturing in an advanced industrial economy
Table of Contents provided by Blackwell. All Rights Reserved.

Supplemental Materials

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The New copy of this book will include any supplemental materials advertised. Please check the title of the book to determine if it should include any access cards, study guides, lab manuals, CDs, etc.

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