Advanced and shaped light fields for the biosciences | |
It's a (meta)material world! The final frontier? | |
Advanced and shaped light fields for the biosciences | |
Coarse frequency comb interferometry | |
Generalized quantitative approach to two-beam fringe visibility (coherence) with different polarizations and frequencies | |
Spatially phase-shifted digital speckle pattern interferometry (SPS-DSPI) and cryogenic structures: recent improvements | |
Instantaneous phase-shift Fizeau interferometer utilizing a synchronous frequency shift mechanism | |
Development of a multi-component shearography instrument for surface strain measurement on dynamic objects | |
Optical wavefront sensor based on sub-wavelength metallic structures | |
A dynamic in-plane deformation measurement using virtual speckle patterns | |
The spatial degree of polarization and the first-order statistical properties of polarization speckle | |
Lockin-speckle-interferometry for non-destructive testing | |
Denoising of digital speckle pattern interferometry fringes by means of Bidimensional Empirical Mode Decomposition | |
Filtering-based phase unwrapping | |
Investigations and improvements of digital holographic tomography applied for 3D studies of trans missive photonics microelements | |
Strain distribution measurement by digital holographic interferometry using three spherical waves | |
Modeling and optical characterization of vibrating micro- and nanostructures | |
Real-time vibration amplitude and phase imaging with heterodyne interferometry and correlation image sensor | |
Laser confocal feedback profilometry | |
New algorithms and error analysis for sinusoidal phase shifting interferometry | |
Iterative algorithm for phase shifting interferometry with finite bandwidth illumination | |
Simultaneous geometry and color texture acquisition using a single-chip color camera | |
Shape and colour measurement of colourful objects by fringe projection | |
Moire topography using a liquid-crystal-grating based frequency modulation technique | |
Fizeau interferometer for quasi parallel optical plate testing | |
Angle-resolved reflectometer for thickness measurement of multi-layered thin-film structures | |
Uncertainty analysis on the absolute thickness of a cavity using a commercial wavelength scanning interferometer | |
Measurement of absolute optical thickness distribution of a mask-glass by wavelength tuning interferometry | |
Dual frequency sweeping interferometry with range-invariant accuracy for absolute distance metrology | |
Micro Fabry-Perot sensor for surface measurement | |
Optimum wavelength selection for the method of excess fractions | |
Multiple wavelength interferometry for surface profiling | |
A hybrid technique for ultra-high dynamic range interferometry | |
Surface profile detection of nanostructures using a Mueller matrix polarimeter | |
3D profilometer employing white-light interferometry for microstructures with large-bevel inclines in brightness-enhanced films | |
Surface metrology of silicon wafers using a femtosecond pulse laser | |
Noncollinear autocorrelation with radially symmetric nondiffracting beams | |
Testing of a diamond-turned off-axis parabolic mirror | |
Distortion mapping correction in aspheric null testing | |
Interferometric null test of a parabolic reflector generating a Hertzian dipole field | |
Optical testing by means of one-dimensional interferograms performed with a point-diffraction interferometer | |
Stitching of off-axis sub-aperture null measurements of an aspheric surface | |
Measurements of aspheric surfaces | |
Wide dynamic beam size range lateral-shear interferometer | |
Interferometer design for optical stochastic cooling demonstration at Bates | |
Optical heterodyne laser encoder for in-plane nanopositioning | |
Temporal phase detection of interferograms without frequency carrier | |
Spatial coherence wavelets and the phase-space representation of holography | |
Method for distant diagnostics of layered media inner structure | |
Dynamic measurement of strain in test specimen by fringe projection | |
An ESPI technique based on panoramic interferometry with paraboloid mirrors | |
Author Index | |
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