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9780819472830

Interferometry XIV: Techniques and Analysis

by ; ;
  • ISBN13:

    9780819472830

  • ISBN10:

    0819472832

  • Format: Paperback
  • Copyright: 2008-08-10
  • Publisher: Society of Photo Optical
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Summary

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Table of Contents

Advanced and shaped light fields for the biosciences
It's a (meta)material world! The final frontier?
Advanced and shaped light fields for the biosciences
Coarse frequency comb interferometry
Generalized quantitative approach to two-beam fringe visibility (coherence) with different polarizations and frequencies
Spatially phase-shifted digital speckle pattern interferometry (SPS-DSPI) and cryogenic structures: recent improvements
Instantaneous phase-shift Fizeau interferometer utilizing a synchronous frequency shift mechanism
Development of a multi-component shearography instrument for surface strain measurement on dynamic objects
Optical wavefront sensor based on sub-wavelength metallic structures
A dynamic in-plane deformation measurement using virtual speckle patterns
The spatial degree of polarization and the first-order statistical properties of polarization speckle
Lockin-speckle-interferometry for non-destructive testing
Denoising of digital speckle pattern interferometry fringes by means of Bidimensional Empirical Mode Decomposition
Filtering-based phase unwrapping
Investigations and improvements of digital holographic tomography applied for 3D studies of trans missive photonics microelements
Strain distribution measurement by digital holographic interferometry using three spherical waves
Modeling and optical characterization of vibrating micro- and nanostructures
Real-time vibration amplitude and phase imaging with heterodyne interferometry and correlation image sensor
Laser confocal feedback profilometry
New algorithms and error analysis for sinusoidal phase shifting interferometry
Iterative algorithm for phase shifting interferometry with finite bandwidth illumination
Simultaneous geometry and color texture acquisition using a single-chip color camera
Shape and colour measurement of colourful objects by fringe projection
Moire topography using a liquid-crystal-grating based frequency modulation technique
Fizeau interferometer for quasi parallel optical plate testing
Angle-resolved reflectometer for thickness measurement of multi-layered thin-film structures
Uncertainty analysis on the absolute thickness of a cavity using a commercial wavelength scanning interferometer
Measurement of absolute optical thickness distribution of a mask-glass by wavelength tuning interferometry
Dual frequency sweeping interferometry with range-invariant accuracy for absolute distance metrology
Micro Fabry-Perot sensor for surface measurement
Optimum wavelength selection for the method of excess fractions
Multiple wavelength interferometry for surface profiling
A hybrid technique for ultra-high dynamic range interferometry
Surface profile detection of nanostructures using a Mueller matrix polarimeter
3D profilometer employing white-light interferometry for microstructures with large-bevel inclines in brightness-enhanced films
Surface metrology of silicon wafers using a femtosecond pulse laser
Noncollinear autocorrelation with radially symmetric nondiffracting beams
Testing of a diamond-turned off-axis parabolic mirror
Distortion mapping correction in aspheric null testing
Interferometric null test of a parabolic reflector generating a Hertzian dipole field
Optical testing by means of one-dimensional interferograms performed with a point-diffraction interferometer
Stitching of off-axis sub-aperture null measurements of an aspheric surface
Measurements of aspheric surfaces
Wide dynamic beam size range lateral-shear interferometer
Interferometer design for optical stochastic cooling demonstration at Bates
Optical heterodyne laser encoder for in-plane nanopositioning
Temporal phase detection of interferograms without frequency carrier
Spatial coherence wavelets and the phase-space representation of holography
Method for distant diagnostics of layered media inner structure
Dynamic measurement of strain in test specimen by fringe projection
An ESPI technique based on panoramic interferometry with paraboloid mirrors
Author Index
Table of Contents provided by Blackwell. All Rights Reserved.

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