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| Preface to the Reissue of the Materials Characterization Series | p. xii |
| Preface to Series | p. xiii |
| Preface to the Reissue of Characterization of Metals and Alloys | p. xiv |
| Preface | p. xv |
| Acronyms Glossary | p. xvi |
| Contributors | p. xviii |
| Introduction | |
| Purpose and Organization of the Book | p. 1 |
| Mechanical Properties and Interfacial Analysis | |
| Introduction | p. 4 |
| Grain Boundary Segregation | p. 6 |
| Temper Embrittlement | p. 8 |
| Corrosion and Stress Corrosion Cracking | p. 12 |
| Hydrogen Embrittlement | p. 17 |
| Creep Embrittlement | p. 19 |
| Future Directions | p. 20 |
| Chemical Properties | |
| Introduction | p. 24 |
| Tools of the Trade-Unique Information Available | p. 25 |
| X-ray Photoelectron Spectroscopy (XPS) | p. 25 |
| Auger Electron Spectroscopy (AES) | p. 29 |
| Secondary Ion Mass Spectrometry (SIMS) | p. 31 |
| Rutherford Backscateering Spectroscopy (RBS), Nuclear Reaction Analysis (NRA), and Ion Channeling | p. 32 |
| Other Methods | p. 32 |
| Gaseous Corrosion | p. 33 |
| High Temperature Corrosion-Influence of Alloy Additions and Coatings | p. 34 |
| Aqueous Corrosion | p. 38 |
| Intergranular Stress Corrosion Cracking | p. 39 |
| Pit Formation | p. 40 |
| Surface Electronic Structure and Chemistry | p. 41 |
| Surface Modification | p. 44 |
| Summary | p. 45 |
| Surface and thin Film Analysis of Diffusion in Metals | |
| Introduction | p. 51 |
| The Mathematics of Diffusion | p. 52 |
| Effects of Non-Uniform Cross Sections | p. 53 |
| Effects of Finite Thickness | p. 54 |
| Analysis Techniques for Diffusion | p. 56 |
| Case Studies of Diffusion | p. 60 |
| Diffusion in Bulk Samples | p. 60 |
| Diffusion in Thin Films | p. 64 |
| Analysis of Surface Diffusion | p. 71 |
| Summary | p. 71 |
| Mineral Processing and Metal Reclamation | |
| Introduction | p. 74 |
| Techniques for Mineral Surface Characterization | p. 75 |
| Direct Analysis of Solid Surface of Particles in a Fluid | p. 75 |
| Surface Characterization of Mineral Particles Separated from the Processing Fluid | p. 78 |
| Surface Bonding in Mineral-Fluid Systems | p. 82 |
| Oxide Mineral Surfaces | p. 82 |
| Sulfide Mineral Surfaces | p. 83 |
| Complementary Composition Analyses of Rough and Polished Surfaces | p. 85 |
| Summary | p. 88 |
| Melting and Casting | |
| Introduction | p. 92 |
| Aluminum-Lithium Alloys | p. 94 |
| Aluminum-Magnesium Alloys | p. 97 |
| Rapidly Solidified Aluminum Alloy Powders | p. 100 |
| Cast Aluminum Alloy Metal Matrix Composites | p. 102 |
| Liquid Aluminum Alloys | p. 104 |
| Summary | p. 105 |
| Machining and Working of Metals | |
| Introduction | p. 108 |
| Physical and Chemical Characterization | p. 109 |
| Physical Properties | p. 109 |
| Chemical Properties | p. 110 |
| Lubrication | p. 112 |
| Surface Finish | p. 114 |
| Metalworking Example | p. 119 |
| Summary | p. 123 |
| Characterization of the Cleaning of Surfaces of Metals and Metal Alloys | |
| Introduction | p. 125 |
| Characterization of Cleaning Procedures | p. 126 |
| Mechanical Cleaning | p. 132 |
| Chemical Cleaning | p. 133 |
| Cleaning in a Vacuum Chamber | p. 136 |
| Detection of Hydrogen and Miscellaneous Cleaning | p. 138 |
| Specimen Handling and Interpretation of Data | p. 138 |
| Summary | p. 140 |
| Coatings and thin Films | |
| Introduction | p. 144 |
| Techniques for Creating Coatings and Thin Films | p. 145 |
| Deposition Techniques | p. 146 |
| Thick Film Coatings | p. 151 |
| Ion Implantation | p. 152 |
| Surface Segregation | p. 152 |
| Thin Film Structures | p. 153 |
| Techniques to Characterize Coatings and Thin Films | p. 153 |
| Studies of Coatings on Metals | p. 155 |
| Polymeric Coatings | p. 155 |
| Tribological Coatings | p. 160 |
| Passivating Coatings | p. 166 |
| Optical and Thermal Coatings | p. 168 |
| Electrodeposition | p. 170 |
| Surface Modifications by Ion Implantation | p. 171 |
| Biocoatings | p. 173 |
| Studies of Thin Films on Metals | p. 173 |
| Metal Thin Films | p. 174 |
| Semiconductor Thin Films | p. 176 |
| Oxide Thin Films | p. 177 |
| Ceramic Thin Films | p. 179 |
| Carbon-Based Thin Films | p. 180 |
| Summary | p. 182 |
| Failure Analysis | |
| Introduction | p. 189 |
| Collaboration with the Applications Engineering Team | p. 191 |
| The Selection of Samples for Analysis | p. 192 |
| The Handling and Shipping of Samples | p. 193 |
| Providing Sample Background Information | p. 194 |
| Failure Analysis Case Histories | p. 195 |
| Metal/Metal Interface and Metal Surface Failures | p. 196 |
| Metal/Inorganic Film Failures | p. 223 |
| Metal/Polymer Interface Failures | p. 232 |
| Summary | p. 240 |
| Appendix: Technique Summaries | |
| Auger Electron Spectroscopy (AES) | p. 247 |
| Cathodoluminescence(CL) | p. 248 |
| Dynamic Secondary Ion Mass Spectrometry (Dynamic SIMS) | p. 249 |
| Elastic Recoil Spectrometry (ERS) | p. 250 |
| Electron Energy-Loss Spectroscopy in the Transmission electron Microscope (EELS) | p. 251 |
| Electron Probe X-Ray Microanalysis (EPMA) | p. 252 |
| Energy-Dispersive X-Ray Spectroscopy (EDS) | p. 253 |
| Extended X-Ray Absorption Fine Structure (EXAFS) | p. 254 |
| Field Ion Microscopy (FIM) | p. 255 |
| Fourier Transform Infrared Spectroscopy (FTIR) | p. 257 |
| Glow-Discharge Mass Spectrometry (GDMS) | p. 258 |
| High-Resolution Electron Energy Loss Spectroscopy (HREELS) | p. 259 |
| Inductively Coupled Plasma Mass Spectrometry (ICPMS) | p. 260 |
| Inductively Coupled Plasma-Optical Emission Spectroscopy (ICP-OES) | p. 261 |
| Ion Scattering Spectroscopy (ISS) | p. 262 |
| Laser Ionization Mass Spectrometry (LIMS) | p. 263 |
| Low-Energy Electron Diffraction (LEED) | p. 264 |
| Low-Energy Electron Microscopy (LEEM) | p. 265 |
| Magneto-Optic Kerr Effect (MOKE) | p. 267 |
| Medium-Energy Ion Scattering with Channeling and Blocking (MEIS) | p. 268 |
| Neutron Activation Analysis (NAA) | p. 269 |
| Nuclear Reaction Analysis (NRA) | p. 270 |
| Optical Micro-Reflectometry (OMR) and Differential Reflectometry (DR) | p. 271 |
| Optical Second Harmonic Generation (SHG) | p. 274 |
| Particle-Induced X-Ray Emission (PIXE) | p. 276 |
| Photoacoustic Spectroscopy (PAS) | p. 277 |
| Photoelectron Emission Microscopy (PEEM) | p. 278 |
| Photoluminescence (PL) | p. 279 |
| Reflected Electron Energy-Loss Spectroscopy (REELS) | p. 280 |
| Reflection High-Energy Electron Diffraction (RHEED) | p. 281 |
| Rutherford Backscattering Spectrometry (RBS) | p. 282 |
| Scanning Electron Microscopy (SEM) | p. 283 |
| Scanning Transmission Electron Microscopy (STEM) | p. 284 |
| Scanning Tunneling Microscopy and Scanning Force Microscopy (STM and SFM) | p. 285 |
| Solid State Nuclear Magnetic Resonance (NMR) | p. 286 |
| Spark Source Mass Spectrometry (SSMS) | p. 287 |
| Sputtered Neutral Mass Spectrometry (SNMS) | p. 288 |
| Static Secondary Ion Mass Spectrometry (Static SIMS) | p. 289 |
| Surface Analysis by Laser Ionization (SALI) | p. 290 |
| Surface Extended X-Ray Absorption Fine Structure and Near Edge X-Ray Absorption Fine Structure (SEXAFS/NEXAFS) | p. 291 |
| Temperature Programmed Desorption (TPD) | p. 292 |
| Total Reflection X-Ray Fluorescence Analysis (TXRF) | p. 295 |
| Transmission Electron Microscopy (TEM) | p. 296 |
| Ultraviolet Photoelectron Spectroscopy (UPS) | p. 297 |
| Variable-Angle Spectroscopic Ellipsometry (VASE) | p. 298 |
| X-Ray Diffraction (XRD) | p. 299 |
| X-Ray Fluorescence (XRF) | p. 300 |
| X-Ray Photoelectron and Auger Electron Diffraction (XPD and AED) | p. 301 |
| X-Ray Photoelectron Spectroscopy (XPS) | p. 302 |
| Index | p. 303 |
| Table of Contents provided by Ingram. All Rights Reserved. |
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